This guy is nuts. Anything approaching the level of backdoors is covered by layers of clearances, compartmentalization, and is almost always performed by government employees, not contractors. There is 0% chance something that important is covered by a stupid NDA. Especially not with the FBI.
I agree it probably isn't true. But I've seen this argument quite a few times about how there is not a chance something this important is covered by an NDA.
People make mistakes. I think this argument has nothing to do with the relevance of his claims. It could be covered by an NDA. Maybe he doesn't understand that it is covered by more. Either way. I just don't see this as an important point.
Intelligence operations, such as this, don't use NDAs when performing contract work (at least not in any project I've ever seen). There's no reason for NDAs - they have a robust, developed clearance infrastructure that assures a much stronger legal commitment than any flimsy NDA can ever offer. As such, work like this is ALWAYS covered under classified rules.
Second, when you go through the clearance process, the consequences and nature of the legal ramifications are burned into you by the documentation and people you have to deal with.
Hence the suspicion that the original claim is bogus. Either that, or the guy who made the claim will most likely be brought up on some very serious charges.
> almost always performed by government employees, not contractors.
Tell that to the numerous private NSA contractors in the business mall across the freeway from Fort Meade. Former Unit 8200 guys are raking in millions.
I submit that you don't know what you're talking about.
I find it suspicious that he mentions the use of scanning tunneling microscopy for analysis of circuit topologies. STM, as far as I know, is useful at the atomic level and would be complete overkill for analyzing ICs today, let alone ten years ago.
I'm not sure what to think, simple slip of the tongue or a sign he's making it all up as he goes along?
Scanning electron microscopy is necessary for analyzing wafers (we have one in the clean room at our university), but I'm not sure that the tunneling features are necessary. From what I understand, you can usually see deep enough with the SEM to see the bottom of the wafer. He does mention the use of SEM and STM as separate topics, though, so I'm not sure that it was a slip of the tongue.
Take a look at this very accessible article on Sparkfun.com for some more information on analysis of circuit topologies. They're analyzing 4-year-old circuits.
In a nutshell, SEM scans the sample with an electron beam and senses the reflected electrons to produce an image, while in STM, a metal probe is scanned across the surface at a very close distance, and variations in the tunneling current between the probe and the sample produce a topological map of the sample (because tunneling current depends strongly on distance).
I don't see how you could use the same machine for both techniques, nor why you would need an STM in a semiconductor fab.
"Why, an attacker can lift the key right off of the memory chip by sliding the notebook under a scanning tunneling microscope! You can see the bits and everything!"
His response reads like "How many important-sounding names and terms can I drop in this email?" Frothing-at-the-mouth levels of Proper Captialization and Acronym Usage.
>>The person I reported to at EOSUA was Zal Azmi, who was later appointed to Chief Information Officer of the FBI by George W. Bush, and who was chosen to lead portions of the EOUSA VPN project based upon his previous experience with the Marines (prior to that, Zal was a mujadeen for Usama bin Laden in their fight against the Soviets...
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[ 4.3 ms ] story [ 40.7 ms ] threadPeople make mistakes. I think this argument has nothing to do with the relevance of his claims. It could be covered by an NDA. Maybe he doesn't understand that it is covered by more. Either way. I just don't see this as an important point.
Second, when you go through the clearance process, the consequences and nature of the legal ramifications are burned into you by the documentation and people you have to deal with.
Hence the suspicion that the original claim is bogus. Either that, or the guy who made the claim will most likely be brought up on some very serious charges.
Tell that to the numerous private NSA contractors in the business mall across the freeway from Fort Meade. Former Unit 8200 guys are raking in millions.
I submit that you don't know what you're talking about.
I'm not sure what to think, simple slip of the tongue or a sign he's making it all up as he goes along?
Take a look at this very accessible article on Sparkfun.com for some more information on analysis of circuit topologies. They're analyzing 4-year-old circuits.
http://www.sparkfun.com/news/384
In a nutshell, SEM scans the sample with an electron beam and senses the reflected electrons to produce an image, while in STM, a metal probe is scanned across the surface at a very close distance, and variations in the tunneling current between the probe and the sample produce a topological map of the sample (because tunneling current depends strongly on distance).
I don't see how you could use the same machine for both techniques, nor why you would need an STM in a semiconductor fab.
That's just odd.