"A neutron hitting a cell on a microprocessor can change the cell’s electrical charge, flipping its binary state from 0 to 1 or from 1 to 0. The result is that although the software code is right and the inputs to the computer are correct, the output is corrupted by this one wrong bit."
As someone who works in this field I have to say this is a really well written article.
Discussing topics like Design Assurance Level and failure condition classification(major vs catastrophic), Single Event Upsets (bit flips), safety assessments in a really clear and well written way.
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[ 3.5 ms ] story [ 20.0 ms ] threadhttps://en.wikipedia.org/wiki/Single_event_upset
Discussing topics like Design Assurance Level and failure condition classification(major vs catastrophic), Single Event Upsets (bit flips), safety assessments in a really clear and well written way.